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Multi-Mode Interference Revealed by Two-Photon Absorption in Silicon-Rich SiO₂ Waveguides

Research article
Abstract
Photoluminescence (PL) from Si nanocrystals (NCs) excited by two-photon absorption (TPA) has been observed in Si nanocrystal-based waveguides fabricated by plasma enhanced chemical vapor deposition. The TPA excited photoluminescence emission resembles the one-photon excited photoluminescence arising from inter-band transitions in the quantum confined Si nanocrystals. By measuring the non-linear transmission of waveguides, a large TPA coefficient of β up to 10⁻⁸ cm/W has been measured at 1550 nm. These values of β depend on the Si NCs size and are two orders of magnitude larger than the bulk silicon value. Here, we propose to use the TPA excited visible PL emission as a tool to map the spatial intensity profile of the 1550 nm propagating optical modes in multimode waveguides. In this way, multimode interference has been revealed experimentally and confirmed through a finite elements simulation.
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Research fields
Top-down
Silicon-rich SiO₂ is patterned into multimode channel waveguides whose width and composition set the supported transverse modes. The structures convert an otherwise hidden near-infrared interference pattern into visible nanocrystal luminescence.
Simulations & fits
Finite-element propagation calculations predict the modal beat lengths, while Fourier analysis extracts the corresponding spatial frequencies from the measured emission. Nonlinear transmission fits also determine the two-photon-absorption coefficient of each material composition.
Characterization
A picosecond 1550-nm pump excites visible photoluminescence through two-photon absorption along the waveguide. Imaging this emission from above directly maps multimode self-imaging and permits comparison of beat periods across widths that are difficult to probe from end transmission alone.
